Ductile dimple rupture (microvoid coalescence) caused by severe over load condition
SEM/EDS: Two (2) Full Systems
Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy with full digital imaging in an essential tool in failure analysis and identification of fracture mode. We can also determine the chemical composition of constituents, contaminants, plating types, etc. Our Brand New SEM/EDS systems are the latest technology and can produce clear images, variable pressure allowing us to see even plastics and all non conductive materials, and perform quantitative chemical analysis, scanning, and mapping.
Some of our SEM Capabilities include:
- Revolutionary automatic alignment functions; auto beam setting, auto aperture, etc.
- Better resolution of any of its kind due to new electron optics
- Real time full screen image, dual image and signal mixing
- Newly developed high sensitivity solid state type BSE detector
- Computer eucentric, 5-axes motorized stage with motorized tilt
- Can accommodate sample as tall as 85 mm for elemental analysis without cutting
- Analytical specimen chamber with optimum geometry for simultaneous accommodation of EDS
- Variable pressure allows observations of wet, oily, and non conductive samples (polymers)
- EDAX Full Energy Dispersive X-Ray Spectroscopy instruments capable of many features:
- Qualitative analysis
- Quantitative analysis
- Elemental Mapping and Scanning
- Fast and Accurate plots of elemental distributions
- Powerful automated particle analysis
- Automated spectrum collection
