Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray Spectroscopy (EDS) with full digital imaging is an essential tool in failure analysis and identification of failure mode. ATRONA has over 30 years of SEM experience. Utilizing the SEM we can determine fracture topography and features for root cause investigation. In failure analysis this is an essential tool and one that we know how to use well. Scanning electron microscopy with EDS is also used for determining the chemical composition of constituents in the microstructure, determining plating types, finding and chemically analyzing contamination, etc.
There is arguably no other instrument with the breadth of applications in the study of solid materials and fracture analysis that compares with the SEM. At ATRONA we have two full SEM/EDS systems. One of these systems is new with cutting edge technology in the field of microscopy giving us an advantage with clear imaging and EDS mapping capabilities. The other SEM was recently upgraded with new software and controls. One of our SEM's is capable of variable pressure allowing us to perform analysis on plastics and all non conductive materials.
Some of our SEM Capabilities include:
- Revolutionary automatic alignment functions; auto beam setting, auto aperture, etc.
- Better resolution of any of its kind due to new electron optics
- Real time full screen image, dual image and signal mixing
- Newly developed high sensitivity solid state type BSE detector
- Computer eucentric, 5-axes motorized stage with motorized tilt
- Can accommodate sample as tall as 85 mm for elemental analysis without cutting
- Analytical specimen chamber with optimum geometry for simultaneous accommodation of EDS
- Variable pressure allows observations of wet, oily, and non conductive samples (polymers)
EDAX Full Energy Dispersive X-Ray Spectroscopy instruments capable of many features:
- Qualitative analysis
- Quantitative analysis
- Elemental Mapping and Scanning
- Fast and Accurate plots of elemental distributions
- Powerful automated particle analysis
- Automated spectrum collection
Micro Porosity Measurements